ジャンル検索条件:理工学-物理学-実験装置・機器分析
71. | Practical Atomic Force Microscopy(RMS-Royal Microscopical Society) hardcover 400 p. '14 978-1-119-99204-2John Wiley & Sons Ltd.(2014/05)
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72. | Ferroelectric Domain Walls 2014th ed.(Springer Theses) H 200 p. 14 978-3-319-05749-1Springer International Publishing(2014/04)
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73. | Handbook of Spectroscopy 2e, 2nd, Completely Revised and Enlarged ed. '14 978-3-527-32150-6Wiley-VCH Verlag GmbH(2014/04)
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74. | International Multidisciplinary Microscopy Congress 2014th ed.(Springer Proceedings in Physics Vol.154) H 500 p. 14 978-3-319-04638-9Springer International Publishing(2014/04)
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75. | Internal Photoemission Spectroscopy 2nd ed. H 404 p. 14 978-0-08-099929-6Elsevier US(2014/03)
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76. | Basic Concepts of X–Ray Diffraction P 312 p. 14 978-3-527-33561-9Wiley-VCH Verlag GmbH(2014/03)
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77. | X-Ray Line Profile Analysis in Materials Science(Research Essentials) H 359 p. 14 978-1-4666-5852-3IGI Global(2014/02)
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78. | Applied Photometry, Radiometry, and Measurements of Optical Losses 2012nd ed.(Springer Series in Optical Sciences Vol.163) P XIX 978-94-017-8526-6Springer Netherlands(2014/02)
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79. | Studying Atomic Dynamics with Coherent X-rays 2012nd ed.(Springer Theses) P X, 98 p. 14 978-3-642-43622-2Springer-Verlag GmbH(2014/02)
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80. | Scanning Probe Microscopy in Industrial Applications:Nanomechanical Characterization '14 978-1-118-28823-8Wiley-Blackwell(2014/01)
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