Scanning Probe Microscopy:A Multidisciplinary Research Tool '23

著者：Garno, Jayne C./Yu, Jing-Jiang/Xu, Song

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内容の説明

One may think that scanning probe microscopy (SPM) instruments are mainly used to 'look' at a surface, as with an optical microscope. However, SPM encompasses dozens of measurement and lithography modes for fundamental studies and applications spanning a broad range of scientific disciplines, such as chemistry, physics, engineering, material science, nanoscience / nanomedicine, and biology. New SPM technologies enable mapping of surface properties and surface manipulation with atomic precision, which makes it now a standard and indispensable tool in labs across these disciplines.This book provides a comprehensive and high-level guide to the operating principles of a wide array of SPM instruments. While the well-known atomic force microscopy (AFM) is covered in-depth in 9 chapters, modern variants are also introduced, such as chemical force microscopy, magnetic force microscopy, scanning electrochemical microscopy, and near-field scanning optical microscopy, amongst many others, concluding with the futuristic artificial intelligence-driven SPM. The authors - one an accomplished Professor of Chemistry and the others senior research scientists with major SPM companies - explain how the science translates into cutting-edge technology and industrial applications.

登録情報

商品コード：1035064088
出版社: World Scientific Publishing Co., Pte. Ltd.
出版年月: 出版予定年月未定
ISBN-10: 9811264740
ISBN-13: 978-981-1264-74-0
出版国: シンガポール
装丁: hardcover/Geb./rel.
媒体: 冊子
ページ数: 300 p.
ジャンル: 自然科学一般